Open AccessTera-sample-per-second single-shot device analyzer
Author(s) -
Zhuoya Bai,
Cejo Konuparamban Lonappan,
Tianwei Jiang,
Asad M. Madni,
Fengping Yan,
Bahram Jalali
Publication year - 2019
Publication title -
optics express
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.27.023321
Subject(s) - optics , computer science , tera , bandwidth (computing) , impulse response , telecommunications , physics , mathematical analysis , mathematics , operating system
With the ever-increasing need for bandwidth in data centers and 5G mobile communications, technologies for rapid characterization of wide-band devices are in high demand. We report an instrument for extremely fast characterization of the electronic and optoelectronic devices with 27 ns frequency-response acquisition time at the effective sampling rate of 2.5 Tera-sample/s and an ultra-low effective timing jitter of 5.4 fs. This instrument features automated digital signal processing algorithms including time-series segmentation and frame alignment, impulse localization and Tikhonov regularized deconvolution for single-shot impulse and frequency response measurements. The system is based on the photonic time-stretch and features phase diversity to eliminate frequency fading and extend the bandwidth of the instrument.