Open AccessIncoherent scattering from dielectric metasurfaces under the influence of electromagnetic eigenmodes
Author(s) -
Roman S. Puzko,
Д. Н. Козлов,
V. I. Fabelinsky,
Yu. N. Polivanov,
Alexander Smirnov,
Andrey K. Sarychev,
Ilya A. Ryzhikov,
Hanna Bandarenka,
A. M. Merzlikin
Publication year - 2019
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.27.021701
Subject(s) - optics , scattering , dielectric , electromagnetic radiation , polarization (electrochemistry) , light scattering , total internal reflection , angle of incidence (optics) , materials science , forward scatter , reflection (computer programming) , radiation , physics , optoelectronics , chemistry , computer science , programming language
Anomalous optical properties of microscopically inhomogeneous dielectric films placed on a thick metal sublayer are investigated. We study the reflection, scattering, and absorption of the coherent electromagnetic radiation as a function of the incidence angle. Computer simulations show the existence of the incidence angle of the laser beam when the scattering and absorption increase simultaneously for the s-polarization so that almost 60% of the incident light goes in the scattering channel. The critical angle corresponds to the excitation of Fabry-Perot mode. The effect makes it possible to manipulate the reflection from the metafilms.