Open AccessMeasurement of thermal effect in laser pumped silicon employing infrared digital holographic interferometry
Author(s) -
Teli Xi,
Shixun Dai,
Ying Li,
Jianglei Di,
Jianlin Zhao
Publication year - 2019
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.27.009439
Subject(s) - optics , materials science , interferometry , coherence (philosophical gambling strategy) , laser , wafer , silicon , coherence length , refractive index , optoelectronics , infrared , physics , superconductivity , quantum mechanics
We present a short-coherence infrared digital holographic interferometry (IRDHI) to quantitatively measure the weak thermal effect in silicon wafer under visible laser pumping. In IRDHI, a superluminescent diode and a narrow-band filter are introduced to eliminate the self-interference fringes and suppress the noise. The effect of coherence length of the detection light source is analyzed and the optimal coherence length range in the proposed configuration is given. Meanwhile, we measure the weak thermal effect in silicon pumped by two different approaches of a continuous visible laser with different powers. The proposed configuration, which shows high stability and sensitivity, can be easily adapted and improved to measure the variation of thermal effect or refractive index in other near infrared transparent materials.