Open AccessAxially-offset differential interference contrast microscopy via polarization wavefront shaping
Author(s) -
Changqin Ding,
Chen Li,
Fengyuan Deng,
Garth J. Simpson
Publication year - 2019
Publication title -
optics express
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.27.003837
Subject(s) - optics , wavefront , physics , axial symmetry , polarization (electrochemistry) , differential interference contrast microscopy , circular polarization , microscopy , offset (computer science) , materials science , microscope , computer science , chemistry , quantum mechanics , programming language , microstrip
Sample-scan phase contrast imaging was demonstrated by producing and coherently recombining light from a pair of axially offset focal planes. Placing a homogeneous medium in one of the two focal planes enables quantitative phase imaging using only common-path optics, recovering absolute phase without halo or oblique-illumination artifacts. Axially offset foci separated by 70 μm with a 10x objective were produced through polarization wavefront shaping using a matched pair of custom-designed microretarder arrays, compatible with retrofitting into conventional commercial microscopes. Quantitative phase imaging was achieved by two complementary approaches: i) rotation of a half wave plate, and ii) 50 kHz polarization modulation with lock-in amplification for detection.