Open AccessPtychographic X-ray computed tomography at a high-brilliance X-ray source
Author(s) -
Simone Sala,
Darren Batey,
Anupama Prakash,
Sharif Ahmed,
Christoph Rau,
Pierre Thibault
Publication year - 2019
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.27.000533
Subject(s) - optics , optical coherence tomography , synchrotron radiation , tomography , physics , x ray optics , ptychography , diamond , phase contrast imaging , synchrotron , light source , x ray , materials science , diffraction , phase contrast microscopy , composite material
Ptychographic X-ray computed tomography is a phase-contrast imaging technique capable of retrieving three-dimensional maps of the index of refraction of the imaged volumes with nanometric resolution. Despite its unmatched reach, its application remains prerogative of a limited number of laboratories at synchrotron sources. We present a detailed description of an experimental procedure and a data analysis pipeline which can be both exploited for ptychographic X-ray computed tomography experiments at any high-brilliance X-ray source. These have been validated at the I13-1 Coherence Branchline within the first experiment of its kind to be successfully carried out on a biological sample at Diamond Light Source.