Open AccessQuantitative differential phase contrast (DPC) microscopy with computational aberration correction
Author(s) -
Michael Chen,
Zachary F. Phillips,
Laura Waller
Publication year - 2018
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.26.032888
Subject(s) - optics , speckle pattern , microscopy , phase retrieval , differential interference contrast microscopy , microscope , phase (matter) , phase contrast imaging , calibration , resolution (logic) , speckle noise , phase contrast microscopy , materials science , physics , computer science , fourier transform , artificial intelligence , quantum mechanics
Differential Phase Contrast (DPC) microscopy is a practical method for recovering quantitative phase from intensity images captured with different source patterns in an LED array microscope. Being a partially coherent imaging method, DPC does not suffer from speckle artifacts and achieves 2× better resolution than coherent methods. Like all imaging systems, however, DPC is susceptible to aberrations. Here, we propose a method of algorithmic self-calibration for DPC where we simultaneously recover the complex-field of the sample and the spatially-variant aberrations of the system, using 4 images with different illumination source patterns. The resulting phase reconstructions are digitally aberration-corrected.