Open AccessTunable-frequency three-dimensional structured illumination microscopy with reduced data-acquisition
Author(s) -
Ana Doblas,
Hasti Shabani,
Genaro Saavedra,
Chrysanthe Preza
Publication year - 2018
Publication title -
optics express
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.26.030476
Subject(s) - optics , materials science , projection (relational algebra) , interference (communication) , microscopy , microscope , interference microscopy , spatial frequency , grid , resolution (logic) , computer science , artificial intelligence , physics , telecommunications , channel (broadcasting) , geometry , mathematics , algorithm
The performance of a tunable three-dimensional (3D) structured illumination microscope (SIM) system and its ability to provide simultaneously super-resolution (SR) and optical-sectioning (OS) capabilities are investigated. Numerical results show that the performance of our 3D-SIM system is comparable with the one provided by a three-wave interference SIM, while requiring 40% fewer images for the reconstruction and providing frequency tunability in a cost-effective implementation. The performance of the system has been validated experimentally with images from test samples, which were also imaged with a commercial SIM based on incoherent-grid projection for comparison. Restored images from data acquired from an axially-thin fluorescent layer show a 1.6× improvement in OS capability compared to the commercial instrument while results from a fluorescent tilted USAF target show the OS and SR capabilities achieved by our system.