
Enhancement of phase retrieval capability in ptychography by using strongly scattering property of the probe-generating device
Author(s) -
Jianhua Zhang,
Jiadong Fan,
Zhibin Sun,
Shengkun Yao,
Yali Tong,
Renzhong Tai,
Huaidong Jiang
Publication year - 2018
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.26.030128
Subject(s) - ptychography , optics , phase retrieval , synchrotron radiation , diffraction , scattering , coherent diffraction imaging , materials science , quality (philosophy) , phase (matter) , frequency domain , sample (material) , physics , computer science , fourier transform , quantum mechanics , computer vision , thermodynamics
In common ptychographic coherent diffractive imaging (PCDI) systems, the probe-generating devices typically exhibit strong scattering, which is not fully used. Here, we report the reasonableness of using the diffraction pattern of the probe-generating device as the frequency-domain information of the scanning probe located in the sample plane, and we propose a method introducing this frequency-domain information into an iterative process to improve the imaging quality of PCDI. The new method was demonstrated using both a visible laser source and a synchrotron radiation X-ray source; the proposed method significantly improved the imaging quality in both demonstrations.