Open AccessSingle-shot aperture-scanning Fourier ptychography
Author(s) -
Xiaoliang He,
Cheng Liu,
Jianqiang Zhu
Publication year - 2018
Publication title -
optics express
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.26.028187
Subject(s) - ptychography , optics , wavefront , fourier transform , resolution (logic) , aperture (computer memory) , interferometry , materials science , physics , computer science , diffraction , artificial intelligence , quantum mechanics , acoustics
Aperture-scanning Fourier ptychography [Opt. Express22, 13586 (2014)] is a promising non-interferometric wavefront measurement technique. It eliminates the thin-sample requirement in typical Fourier ptychography employing angle-varying illumination. However, as aperture-scanning Fourier ptychography is based on step-by-step scanning, it requires long data acquisition time and a high-stability optical system. In this paper, we propose a single-shot aperture-scanning Fourier ptychography method. In our method, multiple low-resolution images are collected in a single shot by inserting a Dammann grating at a certain distance before the aperture, and the images are subsequently converted to a high-resolution complex wavefront. Compared with scanning-based aperture-scanning Fourier ptychography, the total acquisition time of the proposed method is dramatically reduced. The feasibility of our proposed method is demonstrated by proof-of-concept experiments.