Open AccessRandom laser based method for direct measurement of scattering properties
Author(s) -
Federico Tommasi,
Emilio Ignesti,
Lorenzo Fini,
Fabrizio Martelli,
Stefano Cavalieri
Publication year - 2018
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.26.027615
Subject(s) - scattering , optics , random laser , materials science , calibration , light scattering , lasing threshold , laser , coherent backscattering , mean free path , optical path , forward scatter , physics , quantum mechanics
Optical sensing is a very important method for investigating different kinds of samples. Recently, we proposed a new kind of optical sensor based on random lasing [ Sci. Rep.6, 35225 (2016)], that couples the advantages of stimulated emission in detecting small variations on scattering properties of a sensed material, to the needs of no alteration of the sample under investigation. Here, we present a method to achieve a quantitative measurement of the scattering properties of a material. The results on samples of calibrated microspheres show a dependence of the peak intensity of the emission spectrum on the transport mean free path of the light within the sample, whatever the dimension (down to ≈100 nm of particle diameter) and the concentration of scatterers dispersed in the sensed material. A direct and fast measurement of the scattering properties is obtained by calibration with a well-known and inexpensive reference medium.