Open AccessMulti-wavelength multi-angle reflection tomography
Author(s) -
Ting Zhang,
Kévin Unger,
Guillaume Maire,
Patrick C. Chaumet,
A. Talneau,
Charan Godhavarti,
Hugues Giovannini,
Kamal Belkebir,
Anne Sentenac
Publication year - 2018
Publication title -
optics express
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.26.026093
Subject(s) - optics , wavelength , tomography , tomographic reconstruction , reflection (computer programming) , holography , sample (material) , materials science , reflection coefficient , iterative reconstruction , physics , computer science , artificial intelligence , thermodynamics , programming language
We have developed a reflection tomographic microscope in which the sample is reconstructed from different holograms recorded under various angles and wavelengths of incidence. We present an iterative inversion algorithm based on a rigorous modeling of the wave-sample interaction that processes all the data simultaneously to estimate the sample permittivity distribution. We show that using several wavelengths permits a significant improvement of the reconstruction, especially along the optical axis.