Multi-wavelength multi-angle reflection tomography | Zendy

Ting Zhang | Zendy; Kevin D. Unger | Zendy; Guillaume Maire | Zendy; Patrick C. Chaumet | Zendy; A. Talneau | Zendy; Charan Godhavarti | Zendy; Hugues Giovannini | Zendy; Kamal Belkebir | Zendy; Anne Sentenac | Zendy

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Multi-wavelength multi-angle reflection tomography

Author(s) -

Ting Zhang,

Kevin D. Unger,

Guillaume Maire,

Patrick C. Chaumet,

A. Talneau,

Charan Godhavarti,

Hugues Giovannini,

Kamal Belkebir,

Anne Sentenac

Publication year - 2018

Publication title -

optics express

Language(s) - Uncategorized

Resource type - Journals

SCImago Journal Rank - 1.394

H-Index - 271

ISSN - 1094-4087

DOI - 10.1364/oe.26.026093

Subject(s) - optics , wavelength , tomography , tomographic reconstruction , reflection (computer programming) , holography , sample (material) , reflection coefficient , materials science , iterative reconstruction , physics , computer science , artificial intelligence , thermodynamics , programming language

We have developed a reflection tomographic microscope in which the sample is reconstructed from different holograms recorded under various angles and wavelengths of incidence. We present an iterative inversion algorithm based on a rigorous modeling of the wave-sample interaction that processes all the data simultaneously to estimate the sample permittivity distribution. We show that using several wavelengths permits a significant improvement of the reconstruction, especially along the optical axis.

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