Open AccessAdvancement of X-ray radiography using microfocus X-ray source in conjunction with amplitude grating and SOI pixel detector, SOPHIAS
Author(s) -
Ryo Hosono,
Tomonori Kawabata,
Kentaro Hayashida,
Togo Kudo,
Kyosuke Ozaki,
Nobukazu Teranishi,
Takaki Hatsui,
Takuji Hosoi,
Heiji Watanabe,
Takayoshi Shimura
Publication year - 2018
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.26.021044
Subject(s) - optics , dot pitch , grating , pixel , detector , charge sharing , physics , x ray detector , x ray , amplitude , photon energy , phase contrast imaging , image sensor , materials science , photon , phase contrast microscopy
We show how to improve microfocus X-ray radiography by using the SOPHIAS silicon-on-insulator pixel detector in conjunction with an amplitude grating. Single-exposure multi-energy absorption and differential phase contrast imaging was performed using the single amplitude grating method. The sensitivity in differential phase contrast imaging in a two-pixel-pitch setup was enhanced by 39% in comparison with the previously reported method [Rev. Sci. Instrum. 81, 113702 (2010).] by analyzing charge-sharing effects. Small-angle-scattering imaging was also possible in the two-pixel-pitch setup by counting the number of X-ray photons passing the pixel boundaries.