
Sparsity-based super-resolution microscopy from correlation information: erratum
Author(s) -
Oren Solomon,
Maor Mutzafi,
Mordechai Segev,
Yonina C. Eldar
Publication year - 2018
Publication title -
optics express
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.26.020849
Subject(s) - deconvolution , microscopy , optics , resolution (logic) , fluorescence microscope , super resolution microscopy , materials science , fluorescence , physics , scanning confocal electron microscopy , computer science , artificial intelligence