Open AccessDefocusing parameter selection strategies based on PSF measurement for square-binary defocusing fringe projection profilometry
Author(s) -
Yunfan Wang,
Haitao Zhao,
Hongzhi Jiang,
Xudong Li
Publication year - 2018
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.26.020351
Subject(s) - optics , projector , structured light 3d scanner , binary number , point spread function , robustness (evolution) , profilometer , computer science , physics , mathematics , biochemistry , chemistry , arithmetic , scanner , quantum mechanics , surface roughness , gene
Three-dimensional (3D) shape measurement system with binary defocusing technique can perform high-speed and flexible measurements if binary fringe patterns are defocused by projector properly. However, the actual defocusing degree is difficult to set, and the fringe period is difficult to determine accordingly. In this study, we present a square-binary defocusing parameter selection framework. First, we analyze the fringe formation process mathematically. The defocusing degree is quantified and manipulated by using the focusing distance of projector, which is calibrated by point spread function measurement. To optimize parameter selection, single-point sinusoidal error is modeled as the objective function for the evaluation of the defocusing effect. We verify the correctness by using different parameter combinations and object measurements in our experiments. The appropriate defocusing parameters can be easily obtained according to the analysis of practical system setup, which improves the quality and robustness of the system.