z-logo
open-access-imgOpen Access
Depth-driven variable-frequency sinusoidal fringe pattern for accuracy improvement in fringe projection profilometry
Author(s) -
Gang Rao,
Libin Song,
Song Zhang,
Xiangdong Yang,
Ken Chen,
Jing Xu
Publication year - 2018
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.26.019986
Subject(s) - profilometer , optics , structured light 3d scanner , spatial frequency , pixel , robustness (evolution) , accuracy and precision , computer science , mathematics , physics , materials science , surface finish , biochemistry , chemistry , scanner , composite material , gene , statistics
Sinusoidal fringe pattern is widely used in optical profilometry; however, the traditional constant-frequency sinusoidal fringe pattern reduces 3D measurement accuracy in the defocus region. To this end, this paper presents a variable-frequency sinusoidal fringe pattern method that is optimized by the measurement depth. The proposed method improves the pixel matching accuracy and thus increases measurement accuracy. This paper theoretically determines the optimal frequency by analyzing the pixel matching error caused by intense noise in a captured image; presents the online frequency optimization along abscissa and ordinate axes in the sinusoidal fringe patterns; and details the encoding and decoding to use variable-frequency fringe patterns for 3D profilometry. Simulations and experiments demonstrate that our proposed method can improve the 3D measurement accuracy and increase measurement robustness.

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom