Open AccessOptimum thickness of epsilon negative tri-metal layer electrodes for maximizing OLED outcoupling efficiency
Author(s) -
Song Eun Lee,
Jae-Gon Lee,
Young Kwan Kim
Publication year - 2017
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.25.031006
Subject(s) - oled , indium tin oxide , phosphorescent organic light emitting diode , materials science , quantum efficiency , electrode , optoelectronics , phosphorescence , diode , optics , layer (electronics) , physics , nanotechnology , fluorescence , quantum mechanics
A transparent electrode is an essential component that has a strong influence on the extraction of light from organic light-emitting diodes (OLEDs) due to its effect on both electrical and optical performance. In this work, we present theoretical studies, full wave simulations, and experimental results to evaluate the influence of the thickness of epsilon negative tri-metal layer (TML) electrodes on the performance of red phosphorescent OLEDs (PHOLEDs) via an optical microcavity effect. The results show that the external quantum efficiency of the optimized TML-based red PHOLED of 17.6% is significantly improved, and it is approximately 40% higher than that of the conventional indium tin oxide (ITO)-based red PHOLED of 12.5%.