
Quantitative birefringence distribution measurement using mixed-state ptychography
Author(s) -
Xuejie Zhang,
Bei Cheng,
Liu Cheng,
Weixing Shen,
Jianqiang Zhu
Publication year - 2017
Publication title -
optics express
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.25.030851
Subject(s) - ptychography , optics , birefringence , azimuth , anisotropy , physics , interferometry , diffraction
Determining the complete optical behavior of anisotropic samples using ptychography is always a difficult problem. We propose a novel birefringence measurement method based on mixed-state ptychography that can simultaneously obtain the azimuth angle and retardation of anisotropic samples in a single scan. By using a reference system transformation, the two mutually orthogonal object states are unambiguously retrieved, and their errors are greatly reduced. The normalized root mean square errors of the obtained azimuth angle and retardation are 0.0011 and 0.0041, respectively. This method offers more rapid data acquisition; compared to interferometric based methods, it has the advantages of unlimited field of view and a simpler, more stable setup. Further, it opens a new possibility for investigating anisotropic samples by means of mixed-state ptychography.