Open AccessDepth recovering method immune to projector errors in fringe projection profilometry by use of cross-ratio invariance
Author(s) -
Ruihua Zhang,
Hongwei Guo
Publication year - 2017
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.25.029272
Subject(s) - optics , projector , profilometer , cross ratio , projection (relational algebra) , structured light 3d scanner , physics , spatial frequency , mathematics , computer science , artificial intelligence , algorithm , surface roughness , scanner , quantum mechanics