Open AccessHybrid profilometry using a single monochromatic multi-frequency pattern
Author(s) -
Sen Xiang,
Deng Hu,
Li Yu,
Jin Wu,
Yang You,
Qiong Liu,
Zhenwei Yuan
Publication year - 2017
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.25.027195
Subject(s) - profilometer , monochromatic color , optics , classification of discontinuities , computer science , property (philosophy) , phase (matter) , artificial intelligence , algorithm , computer vision , mathematics , physics , surface finish , materials science , epistemology , quantum mechanics , composite material , mathematical analysis , philosophy
In this paper, we propose a novel profilometry scheme to acquire high quality depth, where only a single shot of a monochromatic pattern is utilized. We design a band-wise pattern consisting of fringe bands spatially modulated with coprime periods. After that, with the designed pattern, depth is obtained in a hybrid manner, where both phase-based profilometry and active stereo are incorporated. To be specific, pixels in smooth regions obtain their depth values through phases analysis. Especially, based on depth smooth property, we propose a novel phase unwrapping algorithm, which avoids the problem of error propagation and yields accurate unwrapping phases. On the other hand, for boundary regions, spatial stereo, which is more robust to depth discontinuities, is utilized to modify incorrect depth values. Both theoretical verification and experimental results demonstrate that the proposed scheme can generate high quality depth maps, even for complex scenes and isolated objects.