
Spiral scanning X-ray fluorescence computed tomography
Author(s) -
Martin D. de Jonge,
Andrew Kingston,
Nader Afshar,
Jan Garrevoet,
R. Kirkham,
Gary Ruben,
Glenn R. Myers,
Shane Latham,
Daryl L. Howard,
David Paterson,
C.G. Ryan,
Gawain McColl
Publication year - 2017
Publication title -
optics express
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.25.023424
Subject(s) - optics , synchrotron radiation , tomography , synchrotron , spiral (railway) , physics , fourier transform , resolution (logic) , materials science , computer science , artificial intelligence , mathematical analysis , mathematics , quantum mechanics
Scanning X-ray fluorescence tomography was once considered impractical due to prohibitive measurement time requirements but is now common for investigating metal distributions within small systems. A recent look-ahead to the possibilities of 4 th -generation synchrotron light sources [J. Synchrotron. Radiat. 21, 1031 (2014)] raised the possibility of a spiral-scanning measurement scheme where motion overheads are almost completely eliminated. Here we demonstrate the spiral scanning measurement and use Fourier ring correlation analysis to interrogate sources of resolution degradation. We develop an extension to the Fourier ring correlation formalism that enables direct determination of resolution from the measured sinogram data, greatly enhancing its power as a diagnostic tool for computed tomography.