Open AccessSub-pixel projector calibration method for fringe projection profilometry
Author(s) -
Wei Zhang,
Weishi Li,
Liandong Yu,
Hui Fen Luo,
Zhao Hu,
Haojie Xia
Publication year - 2017
Publication title -
optics express
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.25.019158
Subject(s) - projector , structured light 3d scanner , calibration , profilometer , optics , structured light , projection (relational algebra) , pixel , computer vision , computer science , distortion (music) , artificial intelligence , digital light processing , camera resectioning , mathematics , scanner , physics , algorithm , surface roughness , amplifier , computer network , statistics , bandwidth (computing) , quantum mechanics
Digital projectors are used as standard parts at present in fringe projection profilometry systems to project structured-light patterns onto the object surface to be measured, and the distortion of the projector lens must be calibrated and compensated accurately to satisfy the accuracy requirement of industrial applications. A novel method is proposed to determine the projector pixel coordinates of the marker points of a calibration target accurately in terms of projective transform. With the method, the projector can be calibrated with accuracy of sub-pixel level. The method is applicable for the calibration target with a chessboard pattern or a circle pattern, and the calibration result is independent on the results of camera calibration. Experimental results are shown to demonstrate the effectiveness and validity of the proposed method.