Open AccessGoos-Hänchen effect observed for focused x-ray beams under resonant mode excitation
Author(s) -
Qi Zhong,
Lars Melchior,
Jichang Peng,
Qiushi Huang,
Zhanshan Wang,
Tim Salditt
Publication year - 2017
Publication title -
optics express
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.25.017431
Subject(s) - optics , planar , excitation , beam (structure) , cladding (metalworking) , physics , waveguide , synchrotron , coupling (piping) , total internal reflection , synchrotron radiation , guided mode resonance , interference (communication) , materials science , diffraction , diffraction grating , computer graphics (images) , quantum mechanics , computer science , metallurgy , channel (broadcasting) , electrical engineering , engineering
We have coupled a nano-focused synchrotron beam into a planar x-ray waveguide structure through a thinned cladding, using the resonant beam coupling (RBC) geometry, which is well established for coupling of macroscopic x-ray beams into x-ray waveguides. By reducing the beam size and using specially designed waveguide structures with multiple guiding layers, we can observe two reflected beams of similar amplitudes upon resonant mode excitation. At the same time, the second reflected beam is shifted along the surface by several millimeters, constituting a exceptionally large Goos-Hänchen effect. We evidence this effect based on its characteristic far-field patterns resulting from interference of the multiple reflected beams. The experimental results are in perfect agreement with finite-difference simulations.