Open AccessInterference based localization of single emitters
Author(s) -
Amihai Meiri,
Carl G. Ebeling,
Jason Martineau,
Zeev Zalevsky,
Jordan M. Gerton,
Rajesh Me
Publication year - 2017
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.25.017174
Subject(s) - optics , common emitter , interference (communication) , interferometry , grating , interference microscopy , microscopy , microscope , tracking (education) , resolution (logic) , diffraction grating , super resolution microscopy , physics , materials science , computer science , optoelectronics , telecommunications , artificial intelligence , scanning confocal electron microscopy , psychology , pedagogy , channel (broadcasting)
The ability to localize precisely a single optical emitter is important for particle tracking applications and super resolution microscopy. It is known that for a traditional microscope the ability to localize such an emitter is limited by the photon count. Here we analyze the ability to improve such localization by imposing interference fringes. We show here that a simple grating interferometer can introduce such improvement in certain circumstances and analyze what is required to increase the localization precision further.