Open AccessHigh-frequency background modulation fringe patterns based on a fringe-wavelength geometry-constraint model for 3D surface-shape measurement
Author(s) -
Xinran Liu,
Jonathan Kofman
Publication year - 2017
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.25.016618
Subject(s) - structured light 3d scanner , optics , modulation (music) , discontinuity (linguistics) , spatial frequency , wavelength , surface (topology) , physics , point (geometry) , constraint (computer aided design) , geometry , mathematics , mathematical analysis , acoustics , scanner
A new fringe projection method for surface-shape measurement was developed using four high-frequency phase-shifted background modulation fringe patterns. The pattern frequency is determined using a new fringe-wavelength geometry-constraint model that allows only two corresponding-point candidates in the measurement volume. The correct corresponding point is selected with high reliability using a binary pattern computed from intensity background encoded in the fringe patterns. Equations of geometry-constraint parameters permit parameter calculation prior to measurement, thus reducing measurement computational cost. Experiments demonstrated the ability of the method to perform 3D shape measurement for a surface with geometric discontinuity, and for spatially isolated objects.