Open AccessSilicon nitride O-band (de)multiplexers with low thermal sensitivity
Author(s) -
Ge Gao,
Daigao Chen,
Tao Shen,
Yinglu Zhang,
Shanlin Zhu,
Xi Xiao,
Jinsong Xia
Publication year - 2017
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.25.012260
Subject(s) - multiplexer , materials science , optics , insertion loss , optoelectronics , silicon nitride , sensitivity (control systems) , wavelength division multiplexing , interferometry , gigabit ethernet , wavelength , silicon , multiplexing , ethernet , physics , electronic engineering , telecommunications , computer science , computer network , engineering
In this paper, four-channel cascaded Mach-Zehnder interferometer-based wavelength (de)multiplexers in the O-band are demonstrated experimentally by utilizing silicon nitride (SiN) optical waveguides. By reference to the commonly used 100 Gigabit Ethernet standards, two types of (de)multiplexer devices with different channel spacings are designed and fabricated. Both the devices exhibit low insertion loss and flat passbands. The lower thermo-optical coefficient provided by SiN brings benefits of reduction in thermal sensitivity. The fabricated (de)multiplexers show a temperature-dependent wavelength shift of about 18.5 pm/°C, which is reduced by 75% compared to the standard silicon-based devices.