
High-speed FPGA-based phase measuring profilometry architecture
Author(s) -
Guomin Zhan,
Hongwei Tang,
Kai Zhong,
Zhongwei Li,
Yusheng Shi,
Congjun Wang
Publication year - 2017
Publication title -
optics express
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.25.010553
Subject(s) - field programmable gate array , computer science , pipeline (software) , profilometer , phase (matter) , architecture , computer hardware , materials science , physics , art , visual arts , quantum mechanics , surface roughness , composite material , programming language
This paper proposes a high-speed FPGA architecture for the phase measuring profilometry (PMP) algorithm. The whole PMP algorithm is designed and implemented based on the principle of full-pipeline and parallelism. The results show that the accuracy of the FPGA system is comparable with those of current top-performing software implementations. The FPGA system achieves 3D sharp reconstruction using 12 phase-shifting images and completes in 21 ms with 1024 × 768 pixel resolution. To the best of our knowledge, this is the first fully pipelined architecture for PMP systems, and this makes the PMP system very suitable for high-speed embedded 3D shape measurement applications.