
One-shot profile inspection for surfaces with depth, color and reflectivity discontinuities
Author(s) -
WeiHung Su,
Sih-Yue Chen
Publication year - 2017
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.25.009999
Subject(s) - classification of discontinuities , optics , reflectivity , fourier transform , single shot , shot (pellet) , materials science , physics , mathematics , mathematical analysis , quantum mechanics , metallurgy
A one-shot technique for surfaces with depth, color, and reflectivity discontinuities is presented. It uses windowed Fourier transform to extract the fringe phases and a binary-encoded scheme to unwrap the phases. Experiments show that absolute phases could be obtained with high reliability.