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EUV spectral analysis of ns-laser produced bismuth plasmas at 8-17 nm
Author(s) -
L Liu,
Gerry O'Sullivan,
Fergal O’Reilly,
Elaine Long,
X Wang,
Padraig Dunne
Publication year - 2017
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.25.009974
Subject(s) - extreme ultraviolet , extreme ultraviolet lithography , laser , plasma , materials science , bismuth , spectral line , optics , atomic physics , ultraviolet , plasma diagnostics , physics , quantum mechanics , astronomy , metallurgy
Extreme ultraviolet (EUV) spectra from laser produced bismuth plasmas were recorded in the 8-17 nm spectral region using a Nd:YAG laser with a pulse length of 8 ns operating at a range of laser power densities. Due to the broad-band emission at 8-17 nm, bismuth plasmas show promise as sources of quasicontinuous radiation in the extreme ultraviolet. When varying the incident laser power density, ionic populations of Bi ions at different power densities were estimated by the collisional-radiative (CR) model for explanation of changes in the spectral profile. Comparison of experimental spectra with atomic structure calculations using the Hartree-Fock with configuration interaction (HFCI) code of Cowan was performed in order to identify most of the features in the spectra.

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