Open AccessApplication of phase shifting electronic speckle pattern interferometry in studies of photoinduced shrinkage of photopolymer layers
Author(s) -
Mohesh Moothanchery,
V. Bavigadda,
Manojit Pramanik,
Vincent Toal,
Izabela Naydenova
Publication year - 2017
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.25.009647
Subject(s) - optics , electronic speckle pattern interferometry , speckle pattern , holography , shrinkage , holographic interferometry , materials science , interferometry , photopolymer , phase (matter) , speckle imaging , light intensity , physics , polymer , quantum mechanics , composite material , polymerization
Photoinduced shrinkage occurring in photopolymer layers during holographic recording was determined by phase shifting electronic speckle pattern interferometry. Phase maps were calculated from the changes in intensity at each pixel due to the phase differences introduced between object and reference beams. Shrinkage was then obtained from the changes in phase as recording proceeded. The technique allows for whole field measurement of the dimensional changes in photopolymers during holographic recording.