Open AccessMethod for extending the depth of focus in X-ray microscopy
Author(s) -
Fahu Li,
Yong Guan,
Ying Xiong,
Xiaobo Zhang,
Gang Liu,
Yangchao Tian
Publication year - 2017
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.25.007657
Subject(s) - optics , focus (optics) , microscopy , depth of focus (tectonics) , depth of field , image resolution , resolution (logic) , sample (material) , materials science , microscope , computer science , physics , artificial intelligence , geology , paleontology , subduction , tectonics , thermodynamics
Transmission X-ray microscopy (TXM) is a powerful, nondestructive and three-dimensional imaging tool that has been applied in many fields. However, the ability to image large size samples using high-resolution TXM is restricted due to a limited depth of focus (DOF). In this study, a method based on multiple reconstructed slice stacks of an extended sample at different focal positions is developed to extend the DOF of TXM. The simulation and experimental results demonstrate that this novel method effectively and reliably extend the DOF of high-resolution TXM.