Open AccessDual-energy micro-CT with a dual-layer, dual-color, single-crystal scintillator
Author(s) -
Daniel Maier,
Jonathan Schock,
Franz Pfeiffer
Publication year - 2017
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.25.006924
Subject(s) - scintillator , optics , detector , image resolution , resolution (logic) , stack (abstract data type) , micrometer , collimated light , energy (signal processing) , materials science , physics , computer science , laser , quantum mechanics , artificial intelligence , programming language
A wide range of X-ray imaging applications demand micrometer spatial resolution. In material science and biology especially, there is a great interest in material determination and material separation methods. Here we present a new detector design that allows the recording of a low- and a high-energy radiography image simultaneously with micrometer spatial resolution. The detector system is composed of a layered scintillator stack, two CCDs and an optical system to image the scintillator responses onto the CCDs. We used the detector system with a standard laboratory microfocus X-ray tube to prove the working principle of the system and derive important design characteristics. With the recorded and registered dual-energy data set, the material separation and determination could be shown at an X-ray tube peak energy of up to 160 keV with a spatial resolution of 12 μm. The detector design shows a great potential for further development and a wide range of possible applications.