
Lateral resolution enhancement of confocal microscopy based on structured detection method with spatial light modulator
Author(s) -
He Ni,
Limin Zou,
Qingyuan Guo,
Xumin Ding
Publication year - 2017
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.25.002872
Subject(s) - spatial light modulator , optics , confocal , pinhole (optics) , microscope , confocal microscopy , optical transfer function , image resolution , resolution (logic) , microscopy , materials science , spatial frequency , computer science , physics , artificial intelligence
Lateral resolution in confocal microscope is limited by the size of pinhole. In this paper, we attempt to introduce a new method to achieve structured detection through using spatial light modulator (SLM) to improve it. SLM modulates the Airy disk amplitude distribution according to the detection function in collection arm. Instead of using CCD to capture spot images and modulate them with numerical analysis in virtual structured detection (VSD), this method uses SLM to accomplish these aims with higher imaging rates. Based on simulation and the experiment results, it can be found that coherent transfer function expands and the resolution is 1.6 times as large as that of conventional confocal microscope.