Open AccessPerformance comparison between the InAs-based and GaSb-based type-II superlattice photodiodes for long wavelength infrared detection
Author(s) -
Fangfang Wang,
Jianxin Chen,
Zhicheng Xu,
Yi Zhou,
He Li
Publication year - 2017
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.25.001629
Subject(s) - superlattice , photodiode , dark current , molecular beam epitaxy , materials science , optoelectronics , cutoff frequency , wavelength , infrared , current density , indium arsenide , optics , photodetector , gallium arsenide , epitaxy , physics , nanotechnology , layer (electronics) , quantum mechanics
In this paper, we report on the characterization of InAs/GaAsSb type-II superlattice long wavelength infrared photodiodes grown on InAs substrates by molecular-beam epitaxy and also present the device performance comparison with the superlattice devices grown on GaSb substrates. These devices with PIN structures had a 100% cutoff wavelength of 10 μm. The dark current density of InAs-based device at -30 mV reverse bias was 4.01 × 10 -4 A/cm 2 and the resistance-area product at zero bias (R 0 A) was 36.9 Ωcm 2 . The dark current density of GaSb-based device is higher more than one order of magnitude than that of InAs-based device. The temperature-dependence and bias-dependence of the dark current are studied experimentally and correlated to the theory. Good agreement was achieved between the measured I-V curves and the simulated ones, and between the experimental and theoretically predicted differential resistance values. Compared with InAs-based superlattice device, the generation-recombination current of GaSb-based device is larger and dominates in a wider temperature range due to shorter carrier lifetime and higher defect density.