Open AccessImprovement of Swanepoel method for deriving the thickness and the optical properties of chalcogenide thin films
Author(s) -
Yifei Jin,
Baoan Song,
Zhitai Jia,
Yinan Zhang,
Changgui Lin,
Xunsi Wang,
Shixun Dai
Publication year - 2017
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.25.000440
Subject(s) - chalcogenide , refractive index , materials science , thin film , optics , attenuation coefficient , dispersion (optics) , absorption (acoustics) , chalcogenide glass , absorption spectroscopy , transmission (telecommunications) , optoelectronics , nanotechnology , composite material , telecommunications , computer science , physics
A tangencypoint method (TPM) is presented to derive the thickness and optical constants of chalcogenide thin films from their transmission spectra. It solves the problem of the abnormal value of thickness in the strong absorption region obtained by Swanepoel method. The accuracy of the thickness and refractive index is better than 0.5% by using this method. Moreover, comparing with Swanepoel method by using the same simulation and experimental data from the transmission spectrum, the accuracy of the thickness and refractive index obtained by the TPM is higher in the strong absorption region. Finally the dispersion and absorption coefficient of the chalcogenide films are obtained based on the experimental data of the transmission spectrum by using the TPM.