Open AccessInstantaneous phase shifting deflectometry
Author(s) -
Isaac Trumper,
Heejoo Choi,
Dae Wook Kim
Publication year - 2016
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.24.027993
Subject(s) - optics , fourier transform , phase (matter) , multiplexing , phase retrieval , instantaneous phase , profilometer , computer science , fast fourier transform , physics , computer vision , algorithm , telecommunications , quantum mechanics , filter (signal processing) , surface roughness
An instantaneous phase shifting deflectometry measurement method is presented and implemented by measuring a time varying deformable mirror with an iPhone ® 6. The instantaneous method is based on multiplexing phase shifted fringe patterns with color, and decomposing them in x and y using Fourier techniques. Along with experimental data showing the capabilities of the instantaneous deflectometry system, a quantitative comparison with the Fourier transform profilometry method, which is a distinct phase measuring method from the phase shifting approach, is presented. Sources of error, nonlinear color-multiplexing induced error correction, and hardware limitations are discussed.