Instantaneous phase shifting deflectometry | Zendy

Isaac Trumper | Zendy; Heejoo Choi | Zendy; Dae Wook Kim | Zendy

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Instantaneous phase shifting deflectometry

Author(s) -

Isaac Trumper,

Heejoo Choi,

Dae Wook Kim

Publication year - 2016

Publication title -

optics express

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.394

H-Index - 271

ISSN - 1094-4087

DOI - 10.1364/oe.24.027993

Subject(s) - optics , fourier transform , phase (matter) , multiplexing , phase retrieval , instantaneous phase , profilometer , computer science , fast fourier transform , physics , computer vision , algorithm , telecommunications , quantum mechanics , filter (signal processing) , surface roughness

An instantaneous phase shifting deflectometry measurement method is presented and implemented by measuring a time varying deformable mirror with an iPhone ® 6. The instantaneous method is based on multiplexing phase shifted fringe patterns with color, and decomposing them in x and y using Fourier techniques. Along with experimental data showing the capabilities of the instantaneous deflectometry system, a quantitative comparison with the Fourier transform profilometry method, which is a distinct phase measuring method from the phase shifting approach, is presented. Sources of error, nonlinear color-multiplexing induced error correction, and hardware limitations are discussed.

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