Low temperature-grown GaAs carrier lifetime evaluation by double optical pump terahertz time-domain emission spectroscopy | Zendy

Valynn Katrine Mag-usara | Zendy; Stefan Funkner | Zendy; Gudrun Niehues | Zendy; Elizabeth Ann Prieto | Zendy; Maria Herminia Balgos | Zendy; Armando Somintac | Zendy; Elmer Estacio | Zendy; Arnel Salvador | Zendy; Kohji Yamamoto | Zendy; Muneaki Hase | Zendy; Masahiko Tani | Zendy

Open Access

Low temperature-grown GaAs carrier lifetime evaluation by double optical pump terahertz time-domain emission spectroscopy

Author(s) -

Valynn Katrine Mag-usara,

Stefan Funkner,

Gudrun Niehues,

Elizabeth Ann Prieto,

Maria Herminia Balgos,

Armando Somintac,

Elmer Estacio,

Arnel Salvador,

Kohji Yamamoto,

Muneaki Hase,

Masahiko Tani

Publication year - 2016

Publication title -

optics express

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.394

H-Index - 271

ISSN - 1094-4087

DOI - 10.1364/oe.24.026175

Subject(s) - materials science , terahertz radiation , gallium arsenide , carrier lifetime , terahertz time domain spectroscopy , optoelectronics , optics , spectroscopy , optical pumping , semiconductor , terahertz spectroscopy and technology , laser , physics , silicon , quantum mechanics

We present the use of a "double optical pump" technique in terahertz time-domain emission spectroscopy as an alternative method to investigate the lifetime of photo-excited carriers in semiconductors. Compared to the commonly employed optical pump-probe transient photo-reflectance, this non-contact and room temperature characterization technique allows relative ease in achieving optical alignment. The technique was implemented to evaluate the carrier lifetime in low temperature-grown gallium arsenide (LT-GaAs). The carrier lifetime values deduced from "double optical pump" THz emission decay curves show good agreement with data obtained from standard transient photo-reflectance measurements on the same LT-GaAs samples grown at 250 °C and 310 °C.

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