Open AccessModal phase measuring deflectometry
Author(s) -
Lei Huang,
Juan Xue,
Bo Gao,
Chris McPherson,
Jake Beverage,
Mourad Idir
Publication year - 2016
Publication title -
optics express
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.24.024649
Subject(s) - optics , ray tracing (physics) , phase (matter) , modal , surface (topology) , computer science , calibration , physics , materials science , mathematics , geometry , quantum mechanics , polymer chemistry
In this work, a model based method is applied to phase measuring deflectometry, named modal phase measuring deflectometry. The height and slopes of the surface under test are represented by mathematical models and updated by optimizing the model coefficients to minimize the discrepancy between the reprojection in ray tracing and the actual measurement. The pose of the screen relative to the camera is pre-calibrated and further optimized together with the shape coefficients of the surface under test. Simulations and experiments are conducted to demonstrate the feasibility of the proposed approach.