
Self-phase modulation in highly confined submicron Ta_2O_5 channel waveguides
Author(s) -
Yuan-Yao Lin,
ChengLung Wu,
Wen-Chun Chi,
YiJen Chiu,
YungJr Hung,
Ann-Kuo Chu,
Chao-Kuei Lee
Publication year - 2016
Publication title -
optics express
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.24.021633
Subject(s) - tantalum pentoxide , materials science , optics , modulation (music) , self phase modulation , photonics , kerr effect , wavelength , waveguide , tantalum , optoelectronics , phase modulation , spectral line , cross phase modulation , nonlinear optics , phase (matter) , nonlinear system , dielectric , physics , phase noise , laser , quantum mechanics , astronomy , acoustics , metallurgy
Optical spectra broadening as a result self-phase modulation in a channel waveguide fabricated on a high quality tantalum pentoxide (Ta 2 O 5 ) film by using RF sputtering is measured. The full-width at half maximum of the optical spectra for transverse electric (TE)/transverse magnetic (TM) polarizations of 42.5/31.7 nm is obtained using pulses of 10 nm at a wavelength of 800 nm with a peak-coupled power of 43.77 W. The nonlinear Kerr coefficients of 2.14 × 10 -14 cm 2 /W and 1.92 × 10 -14 cm 2 /W for TE and TM polarizations, respectively, are then extracted from the experiments using a theoretical model based on the method of moments. The obtained results on the nonlinearity further suggest that Ta 2 O 5 is a promising material to develop nonlinear waveguide devices for integrated photonics.