Open AccessNumerical studies of focal modulation microscopy in high-NA system
Author(s) -
Bingzhao Zhu,
Shuhao Shen,
Yao Zheng,
Wei Gong,
Ke Si
Publication year - 2016
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.24.019138
Subject(s) - optics , microscopy , confocal microscopy , polarization (electrochemistry) , diffraction , image resolution , materials science , microscope , physics , chemistry
High spatial resolution with deep imaging penetration depth is the main advantage of focal modulation microscopy (FMM). This paper investigates effects of polarization on FMM in a high-NA system based on vectorial diffraction theory. Compared with confocal microscopy, FMM shows a 20.1% improvement in axial resolution. The performance of different polarization patterns is also discussed numerically. The study on polarization modulation may provide a new way to obtain a tighter focal spot.