Numerical studies of focal modulation microscopy in high-NA system | Zendy

Bingzhao Zhu | Zendy; Shuhao Shen | Zendy; Yao Zheng | Zendy; Wei Gong | Zendy; Ke Si | Zendy

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Numerical studies of focal modulation microscopy in high-NA system

Author(s) -

Bingzhao Zhu,

Shuhao Shen,

Yao Zheng,

Wei Gong,

Ke Si

Publication year - 2016

Publication title -

optics express

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.394

H-Index - 271

ISSN - 1094-4087

DOI - 10.1364/oe.24.019138

Subject(s) - optics , microscopy , confocal microscopy , polarization (electrochemistry) , diffraction , image resolution , materials science , microscope , physics , chemistry

High spatial resolution with deep imaging penetration depth is the main advantage of focal modulation microscopy (FMM). This paper investigates effects of polarization on FMM in a high-NA system based on vectorial diffraction theory. Compared with confocal microscopy, FMM shows a 20.1% improvement in axial resolution. The performance of different polarization patterns is also discussed numerically. The study on polarization modulation may provide a new way to obtain a tighter focal spot.

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