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Z-scan for thin media with more than one nonlocal nonlinear response
Author(s) -
B. A. Martínez Irivas,
M. L. Arroyo Carrasco,
M. M. Méndez Otero,
R. Ramos García,
M. D. Iturbe Castillo
Publication year - 2016
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.24.013387
Subject(s) - optics , nonlinear system , gaussian , nonlinear optics , physics , thin film , refractive index , kerr effect , z scan technique , materials science , quantum mechanics , laser
A model to characterize the response of a thin media that can exhibit more than one nonlocal nonlinear response when it is illuminated with a Gaussian beam in a z-scan experiment is proposed. The model considers that these nonlocal contributions can be treated as independent contributions in the refractive or absorptive nonlinear response. Numerical results for two nonlocal nonlinear contributions with different magnitudes between them are presented. Experimental results obtained from a hydrogenated amorphous silicon sample are used to corroborate this model.

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