Open AccessCurved gratings as an integrated photon fluence monitor in x-ray transmission scattering experiments
Author(s) -
Michael Schneider,
C. Günther,
Clemens von Korff Schmising,
Bastian Pfau,
Stefan Eisebitt
Publication year - 2016
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.24.013091
Subject(s) - optics , extreme ultraviolet , fluence , physics , photon , scattering , x ray optics , detector , materials science , laser , x ray
A concept to obtain a measure of the photon flux accepted by a solid sample in single-shot transmission experiments with extreme ultraviolet (XUV) or soft x-ray radiation is demonstrated. Shallow, continuously distorted gratings are used to diffract a constant fraction of the incident photons onto an extended area of a CCD detector. The signal can be tailored to fit the dynamic range of the detector, i.e. matching the scattered intensity of the studied structure of interest. Furthermore, composite grating designs that also allow for the measurement of the spatial photon distribution on the sample are demonstrated. The gratings are directly fabricated by focused ion-beam (FIB) lithography into a Si 3 N 4 membrane that supports the actual sample layer. This allows for rapid fabrication of hundreds of samples, making the concept suitable for systematic studies in destructive single-shot measurements at free-electron laser (FEL) sources. We demonstrate relative photon flux measurements in magnetic scattering experiments with synchrotron and FEL radiation at 59.6 eV photon energy.