Guided-mode resonance assisted directional emission of a wavelength-shifting film for application in scintillation detection | Zendy

Shuang Wu | Zendy; Bo Liu | Zendy; Zhichao Zhu | Zendy; Chuanwei Cheng | Zendy; Hong Chen | Zendy; Mu Gu | Zendy; Liang Chen | Zendy; Jinling Liu | Zendy; Xiaoping Ouyang | Zendy; Chaofan Xue | Zendy; Yanqing Wu | Zendy

Open Access

Guided-mode resonance assisted directional emission of a wavelength-shifting film for application in scintillation detection

Author(s) -

Shuang Wu,

Bo Liu,

Zhichao Zhu,

Chuanwei Cheng,

Hong Chen,

Mu Gu,

Liang Chen,

Jinling Liu,

Xiaoping Ouyang,

Chaofan Xue,

Yanqing Wu

Publication year - 2016

Publication title -

optics express

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.394

H-Index - 271

ISSN - 1094-4087

DOI - 10.1364/oe.24.000231

Subject(s) - materials science , optics , scintillation , wavelength , optoelectronics , total internal reflection , thin film , guided mode resonance , luminescence , photonic crystal , reflection (computer programming) , nanotechnology , physics , detector , diffraction grating , computer science , programming language

Thin-film luminescent layers as wavelength shifters using in the scintillation detection system suffer with low efficiency due to the total internal reflection and the non-directional emission. In the present work, we design and fabricate a photonic crystal on the surface of LuTaO(4):Eu(3+) thin-film which is a newly developed luminescent material using in radiation detection systems. The entire structure shows guided-mode resonances with only one TE and TM mode. As a result, the emitting light is effectively extracted. Furthermore, due to only two modes existing in the layer, the directionality of emission is strongly controlled. This result enables the structured LuTaO(4):Eu(3+) thin-film to be a potential wavelength shifter with high-efficiency.

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