Open AccessGuided-mode resonance assisted directional emission of a wavelength-shifting film for application in scintillation detection
Author(s) -
Shuang Wu,
Bo Liu,
Zhichao Zhu,
Chuanwei Cheng,
Chen Hong,
Ming Gu,
Liang Chen,
Jinling Liu,
Xiaoping Ouyang,
Chunlai Xue,
Yanqing Wu
Publication year - 2016
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.24.000231
Subject(s) - materials science , optics , scintillation , wavelength , optoelectronics , total internal reflection , thin film , guided mode resonance , luminescence , photonic crystal , reflection (computer programming) , nanotechnology , physics , detector , diffraction grating , computer science , programming language
Thin-film luminescent layers as wavelength shifters using in the scintillation detection system suffer with low efficiency due to the total internal reflection and the non-directional emission. In the present work, we design and fabricate a photonic crystal on the surface of LuTaO(4):Eu(3+) thin-film which is a newly developed luminescent material using in radiation detection systems. The entire structure shows guided-mode resonances with only one TE and TM mode. As a result, the emitting light is effectively extracted. Furthermore, due to only two modes existing in the layer, the directionality of emission is strongly controlled. This result enables the structured LuTaO(4):Eu(3+) thin-film to be a potential wavelength shifter with high-efficiency.