Open AccessParallelized multichannel BSDF measurements
Author(s) -
Alexander von Finck,
Marcus Trost,
Sven Schröder,
Angela Duparré
Publication year - 2015
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.23.033493
Subject(s) - optics , light scattering , scattering , bidirectional reflectance distribution function , multiplexing , polarization (electrochemistry) , ray , wavelength , orthogonal frequency division multiplexing , physics , channel (broadcasting) , materials science , computer science , reflectivity , telecommunications , chemistry
The intensity of scattered light is extremely sensitive to even small changes of illumination wavelength, incident angle, polarization states, or even the measurement position. To obtain light scattering distributions with varied parameters, time-consuming sequential measurement procedures are typically employed. Here, we propose a concept for the measurement of multiple properties at the same time. This is achieved by tailoring orthogonal frequency division multiplexing (OFDM) for light scattering measurement techniques to the required low inter-channel crosstalk performance. The concept is used for a highly-robust roughness and contamination characterization, to derive one-shot roughness information, as well as to characterize color and appearance.