Open AccessNumerical analysis of partially coherent radiation at soft x-ray beamline
Author(s) -
Xiangyu Meng,
Chunlai Xue,
Huaina Yu,
Yong Wang,
Yanqing Wu,
Renzhong Tai
Publication year - 2015
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.23.029675
Subject(s) - beamline , optics , coherence (philosophical gambling strategy) , physics , synchrotron radiation , diffraction , wavefront , synchrotron , mutual coherence , ptychography , coherent diffraction imaging , coherence time , coherence length , coherence theory , x ray optics , beam (structure) , x ray , laser , phase retrieval , fourier transform , superconductivity , quantum mechanics
A new model for numerical analysis of partially coherent x-ray at synchrotron beamlines is presented. The model is based on statistical optics. Four-dimensional coherence function, Mutual Optical Intensity (MOI), is applied to describe the wavefront of the partially coherent light. The propagation of MOI through optical elements in the beamline is deduced with numerical calculation. The coherence of x-ray through beamlines can be acquired. We applied the model to analyze the coherence in the STXM beamline at SSRF, and got the coherence length of the beam at the endstation. To verify the theoretical results, the diffraction experiment of a single slit was performed and the diffraction pattern was simulated to get the coherence length, (31 ± 3.0) µm × (25 ± 2.1) µm (H × V), which had a good agreement with the theoretical results, (30.7 ± 0.6) µm × (31 ± 5.3) µm (H × V). The model is applicable to analyze the coherence in synchrotron beamlines.