Open AccessDiffraction properties of multilayer Laue lenses with an aperture of 102 µm and WSi_2/Al bilayers
Author(s) -
Adam Kubec,
Naresh Kujala,
Ray Conley,
Nathalie Bouet,
Juan Zhou,
Tim Mooney,
Deming Shu,
J. Kirchman,
Kurt Goetze,
J. Mäser,
Albert T. Macrander
Publication year - 2015
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.23.027990
Subject(s) - optics , diffraction , materials science , advanced photon source , focal length , lens (geology) , x ray optics , x ray crystallography , beamline , fabrication , wavelength , diffraction efficiency , optoelectronics , x ray , physics , beam (structure) , medicine , alternative medicine , pathology
We report on the characterization of a multilayer Laue lens (MLL) with large acceptance, made of a novel WSi2/Al bilayer system. Fabrication of multilayers with large deposition thickness is required to obtain MLL structures with sufficient apertures capable of accepting the full lateral coherence length of x-rays at typical nanofocusing beamlines. To date, the total deposition thickness has been limited by stress-buildup in the multilayer. We were able to grow WSi2/Al with low grown-in stress, and asses the degree of stress reduction. X-ray diffraction experiments were conducted at beamline 1-BM at the Advanced Photon Source. We used monochromatic x-rays with a photon energy of 12 keV and a bandwidth of ΔE/E=5.4·10(-4). The MLL was grown with parallel layer interfaces, and was designed to have a large focal length of 9.6 mm. The mounted lens was 2.7 mm in width. We found and quantified kinks and bending of sections of the MLL. Sections with bending were found to partly have a systematic progression in the interface angles. We observed kinking in some, but not all, areas. The measurements are compared with dynamic diffraction calculations made with Coupled Wave Theory. Data are plotted showing the diffraction efficiency as a function of the external tilting angle of the entire mounted lens. This way of plotting the data was found to provide an overview into the diffraction properties of the whole lens, and enabled the following layer tilt analyses.