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Local detection efficiency of a NbN superconducting single photon detector explored by a scattering scanning near-field optical microscope
Author(s) -
Qiang Wang,
Jelmer J. Renema,
A. Engel,
M. P. van Exter,
M. J. A. de Dood
Publication year - 2015
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.23.024873
Subject(s) - optics , detector , microscope , near field scanning optical microscope , scattering , materials science , optical microscope , absorption (acoustics) , near and far field , photon , microscopy , physics , optoelectronics , scanning electron microscope
We propose an experiment to directly probe the local response of a superconducting single photon detector using a sharp metal tip in a scattering scanning near-field optical microscope. The optical absorption is obtained by simulating the tip-detector system, where the tip-detector is illuminated from the side, with the tip functioning as an optical antenna. The local detection efficiency is calculated by considering the recently introduced position-dependent threshold current in the detector. The calculated response for a 150 nm wide detector shows a peak close to the edge that can be spatially resolved with an estimated resolution of ∼ 20 nm, using a tip with parameters that are experimentally accessible.

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