Open AccessModified sequential algorithm for the on-line characterization of optical coatings
Author(s) -
Alexander V. Tikhonravov,
Artur Gorokh
Publication year - 2015
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.23.023561
Subject(s) - algorithm , broadband , layer (electronics) , coating , optics , computer science , optical coating , line (geometry) , materials science , characterization (materials science) , physics , mathematics , nanotechnology , geometry
We present a new algorithm for the on-line determination of thicknesses of deposited layers that can be used in the course of coating production with broadband optical monitoring. The proposed algorithm can be considered as a modification of the well-known sequential algorithm. The main idea of the new algorithm is to re-calculate thicknesses of some of the previously deposited layers along with the determination of the thickness of the last deposited layer. The algorithm implies analytical estimations that enable recalculating only those layer thicknesses that can be found with better accuracy than before. Simulation and computational manufacturing experiments confirm high accuracy of the proposed algorithm.