Open AccessSpeckle based X-ray wavefront sensing with nanoradian angular sensitivity
Author(s) -
Hongchang Wang,
Yogesh Kashyap,
Kawal Sawhney
Publication year - 2015
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.23.023310
Subject(s) - optics , wavefront , speckle pattern , metrology , physics , x ray optics , speckle imaging , phase contrast imaging , phase retrieval , x ray , phase contrast microscopy , fourier transform , quantum mechanics
X-ray wavefront sensing techniques play an important role in both in situ metrology of X-ray optics and X-ray phase contrast imaging. In this letter, we report an approach to measure wavefront aberrations simply using abrasive paper. The wavefront phase change induced by the sample under test was extracted from the speckle displacement by applying a cross-correlation algorithm to two series of speckle images collected using two one-dimensional scans, whilst scanning the abrasive paper in a transverse direction to the incident X-ray beam. The angular sensitivity of the proposed method is shown to be around 2 nanoradians. The potential of the proposed technique for characterizing X-ray optics and the study of biomedical specimens is demonstrated by imaging representative samples.