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Multi-section core-shell InGaN/GaN quantum-well nanorod light-emitting diode array
Author(s) -
Charng-Gan Tu,
Yufeng Yao,
CheHao Liao,
ChihYing Su,
Chieh Hsieh,
Chi–Ming Weng,
Chun-Han Lin,
Hao-Tsung Chen,
YeanWoei Kiang,
C. C. Yang
Publication year - 2015
Publication title -
optics express
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.23.021919
Subject(s) - materials science , cathodoluminescence , photoluminescence , indium , light emitting diode , chemical vapor deposition , optoelectronics , nanorod , wavelength , optics , quantum well , diode , laser , luminescence , nanotechnology , physics
The growth of a two-section, core-shell, InGaN/GaN quantum-well (QW) nanorod- (NR-) array light-emitting diode device based on a pulsed growth technique with metalorganic chemical vapor deposition is demonstrated. A two-section n-GaN NR is grown through a tapering process for forming two uniform NR sections of different cross-sectional sizes. The cathodoluminescence (CL), photoluminescence (PL), and electrolumines-cence (EL) characterization results of the two-section NR structure are compared with those of a single-section NR sample, which is prepared under the similar condition to that for the first uniform NR section of the two-section sample. All the CL, PL, and EL spectra of the two-section sample (peaked between 520 and 525 nm) are red-shifted from those of the single-section sample (peaked around 490 nm) by >30 nm in wavelength. Also, the emitted spectral widths of the two-section sample become significantly larger than their counterparts of the single-section sample. The PL spectral full-width at half-maximum increases from ~37 to ~61 nm. Such variations are attributed to the higher indium incorporation in the sidewall QWs of the two-section sample due to the stronger strain relaxation in an NR section of a smaller cross-sectional size and the more constituent atom supply from the larger gap volume between neighboring NRs.