Open AccessSpatio-TEmporally REsolved Optical Laser Induced Damage (STEREO LID) technique for material characterization
Author(s) -
Yejia Xu,
Luke A. Emmert,
Wolfgang Rudolph
Publication year - 2015
Publication title -
optics express
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.23.021607
Subject(s) - optics , laser , materials science , ablation , laser beams , characterization (materials science) , laser ablation , physics , aerospace engineering , engineering
A technique for measuring the ablation and laser-induced damage threshold (LIDT) by identifying the temporal onset of damage and location of initiation within the beam profile is demonstrated. This new method, dubbed Spatio-TEmporally REsolved Optical Laser Induced Damage (STEREO LID), is compared to traditional damage tests and its advantages are exemplified.